S21 and S12 represent transmission, a measurement of the signal from one port to another. We can relate reflection to return loss, which is the measure of how much signal is lost when it is reflected to the source. Reflection is a parameter that describes how much power is reflected back from the port of measurement. In a two-port network, S11 and S22 represent reflection. S-parameters have two numbers associated with them, the first number represents the port at which power is found, and the second number represents the port at which the power originated from. Scattering parameters (S-parameters) is the method used to characterize the device and tells us the ratio of power transferred between two ports (or however many ports the device has). One example of this is to accelerate installation and maintenance work of satellite ground stations.Ī network analyzer measures both magnitude and phase. Another area network analysis is greatly needed for is field testing outside of the lab. The first application for using a network analyzer is generally in the lab with a benchtop-top analyzer, for extreme RF precision. In this blog, we will go over some core measurements to prepare you for making RF measurements, S-parameters, what a Smith chart is, and different types of loss. Testing these systems ensures distortion-free transmission of communication signals and ensures a good match when absorbing power.įigure 1: Network Analyzers can test a wide variety of passive and active devices to test components and verify specifications to complex RF systems. We use network analyzers to test these components to verify specifications of building blocks for more complex RF systems. These powerful devices are used in various stages of product development and can be used to verify the performance of various components such as antennas, amplifiers, cables, and many other active or passive devices. This includes network testing for wifi, computer networks, cell phone coverage, and much more. Vector network analyzers are crucial for the characterization of the devices and components used in radio frequency and microwave systems.
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